Vectomag

LNPS-80 Low Temperature Probe Station

LNPS-80 low-temperature probe station enables precise DC, RF and microwave testing from 80 K to 425 K with high stability and modular design.

LNPS-80 Low Temperature Probe Station View full-size image

Selection at a glance

Temperature range
80 K – 425 K
Temperature stability
≤ 50 mK

1. Product Overview

The Vectomag LNPS-80 Low Temperature Probe Station provides a reliable platform for non-destructive electrical, optical, and microwave measurements on materials and semiconductor devices.

It supports device sizes up to 80 mm, making it ideal for research on nanoelectronic materials, quantum wires, quantum dots, and semiconductor structures.

The LNPS-80 offers precise temperature control from 80 K to 425 K, using liquid nitrogen cooling with a heat-shielded chamber that reduces blackbody radiation and minimizes LN2 consumption.

Its modular design allows users to configure probes, sample stages, and measurement cables for different experimental needs, supporting DC, RF, and microwave measurements.

3. Technical Specifications

LNPS-80 Cooling Curve

LNPS-80 Temperature Control Curve

3. Technical Specifications
ParameterValue
Temperature range 80 K – 425 K
Temperature stability ≤ 50 mK
Maximum sample size 80 mm
Number of probe arms 4 (3 DC + 1 Microwave 40 GHz)
Probe tip diameter 10 µm
Probe arm travel (XY) ± 25 mm
Probe arm travel (Z) > 50 mm
Probe arm material 304 Stainless Steel + G10 Composite
Cooling method Liquid nitrogen with thermal radiation shield
Microscope High-magnification optical microscope
Measurement modes DC / RF / Microwave

5. System Configuration

  • LNPS-80 main chamber and base platform
  • Four-axis precision probe arms
  • Interchangeable sample stage (80 mm max)
  • Temperature sensor + heater for PID control
  • Liquid nitrogen dewar with insulated transfer line
  • High-magnification microscope module
  • Measurement cables and feedthroughs for DC / RF / microwave testing

2. Key Features

  • Liquid nitrogen cooling for fast and stable temperature control
  • Interchangeable sample stages for flexible configuration
  • Temperature range: 80 K – 425 K
  • Temperature stability: ≤ 50 mK
  • Probe position accuracy: 10 µm
  • Four precision probe arms, each with XYZ fine adjustment
  • Three DC coaxial probes + one 40 GHz microwave probe
  • Probe travel: XY 25 mm / Z > 50 mm
  • High-magnification optical microscope for accurate alignment and imaging
  • Beryllium / tungsten probes minimize thermal conduction to the sample


4. Testable Samples & Applications

  • Semiconductor devices and integrated circuits
  • Nanoelectronic / quantum dot / quantum wire materials
  • MEMS and superconducting devices
  • Electrical and optoelectronic characterization under cryogenic conditions
  • DC, RF, and microwave parameter testing

6. Optional Accessories

  • Additional DC and RF probe arms
  • Cryogenic camera or optical window for visual observation
  • High-frequency connectors (> 40 GHz)
  • Customized sample holders for wafer or chip testing
  • Vacuum pumping and pressure control modules

7. Software Functions

  • Real-time temperature display and data logging
  • PID temperature stabilization control
  • Graphical cooling and warming curves for data analysis
  • Auto shutdown and protection functions
  • Data export in CSV / TXT format

Pricing & availability

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