1D In-Plane Magnetic Field Probe Station
High-precision cryogenic probe station delivering stable 1D in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Suitable for material testing.
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Wafer-Level Vertical Magnetic Field Probe Station
High-precision wafer-level probe station with vertical magnetic field, ±1% field uniformity, and 0.02 mT resolution. Designed for cryogenic material testing.
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1D Vertical Magnetic Field Probe Station
Cryogenic probe station delivering a uniform 1D vertical magnetic field (±1%@⌀2 mm) with high-resolution field monitoring (0.02 mT).
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2D Magnetic Field Cryogenic Probe Station
Dual-axis cryogenic probe station delivering vertical and in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Ideal for semiconductor testing.
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