Atomic Force Microscope for Nanostructure Imaging
This AFM system captures 3D nanostructure images of conductive, semiconductive, and insulating materials with 20 pm resolution and automated scanning control.
View productVectomag
Multi-Channel LCR Measurement System
This system supports multi-channel LCR testing for precise measurement of capacitance, inductance, and resistance in components, materials, and sensor R&D.
View full-size image
Technical enquiry
Discuss your requirements.
Contact us for specifications and configuration information. Tell us about your sample, measurement range, accuracy and operating conditions.
Ask about specificationsExplore more products
Explore the product range.
Browse instruments and systems for your laboratory requirements.
Dielectric Charging & Discharging Measurement System
This system evaluates the charge and discharge behavior of dielectric materials under high voltage conditions, ideal for energy storage and capacitor research.
View product
Dielectric Property Measurement System
This system measures permittivity, capacitance, and dielectric loss of insulating materials across wide frequency and temperature ranges, with optional breakdown and TSDC tests.
View productPricing & availability
Request a quote for Multi-Channel LCR Measurement System.
Tell us about your sample, measurement range, accuracy and operating conditions. Share your required quantity and delivery location.
Request a Quote ↗