Atomic Force Microscope for Nanostructure Imaging
This AFM system captures 3D nanostructure images of conductive, semiconductive, and insulating materials with 20 pm resolution and automated scanning control.
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Ferroelectric Characterization and Hysteresis Test System
This system performs ferroelectric hysteresis loop, fatigue, imprint, leakage, and C - V tests, as well as dielectric and capacitance characterization for material evaluation.
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Dielectric Charging & Discharging Measurement System
This system evaluates the charge and discharge behavior of dielectric materials under high voltage conditions, ideal for energy storage and capacitor research.
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Dielectric Property Measurement System
This system measures permittivity, capacitance, and dielectric loss of insulating materials across wide frequency and temperature ranges, with optional breakdown and TSDC tests.
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